Standard radiation hardness assurance methodologies prescribe fixed heavy-ion test fluences, typically 10^7 ions/cm2, to screen for Destructive Single Event Effects (DSEE). This paper examines the statistical and physical foundations behind this number. We show that a radiation test is a sequence of Bernoulli trials whose aggregate behaviour is described by the Poisson distribution, establishing a direct relationship between test fluence, device cross section, and statistical confidence. By inverting this relationship through orbital event rate analysis, we derive the maximum permissible cross section for a given mission and translate it into a target fluence. For a 550 km sun-synchronous orbit over 7 years, the analysis recovers the standard 10^7 for the most conservative case, an unknown device without redundancy, providing a first-principles justification
for the established value. The analysis further reveals that system-level redundancy is a powerful and underutilized lever: a single redundant device reduces the required test fluence by
approximately one order of magnitude, independent of device characteristics. At stringent survival targets such as 99.997%, redundancy transforms an effectively untestable per-device requirement (MTTF > 200,000 years) into a practical one (MTTF∼ 1,200 years with one spare). These results do not replace existing standards but offer a complementary perspective that connects test specifications to the missions they serve, and provide a quantitative basis for incorporating redundancy into radiation test planning.